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Resumen:
Study and comparison of different Machine Learning-based approaches to solve the inverse problem in Electrical Impedance Tomographies

bs.conference.acronymJISBD
bs.conference.nameJornadas de Ingeniería del Software y Bases de Datos (JISBD)
bs.edition.date2023-09-12
bs.edition.locationCiudad Real
bs.edition.nameXXVII Jornadas de Ingeniería del Software y Bases de Datos (JISBD 2023)
bs.proceedings.editorDurán Toro, Amador
bs.proceedings.nameActas de las XXVII Jornadas de Ingeniería del Software y Bases de Datos (JISBD 2023)
dc.contributor.affiliationDepartment of Electrónica e Computación, Universidade de Santiago de Compostela, Santiago de Compostela, Spain, Spain
dc.contributor.affiliationDepartment of Electrónica e Computación, Universidade de Santiago de Compostela, Santiago de Compostela, Spain, Spain
dc.contributor.affiliationDepartment of Electrónica e Computación, Universidade de Santiago de Compostela, Santiago de Compostela, Spain, Spain
dc.contributor.affiliationDepartment of Electrónica e Computación, Universidade de Santiago de Compostela, Santiago de Compostela, Spain, Spain
dc.contributor.authorAller Domínguez, Martín
dc.contributor.authorMera, David
dc.contributor.authorCotos, José Manuel
dc.contributor.authorVillarroya, Sebastián
dc.contributor.emailmartin.aller.dominguez@gmail.com
dc.contributor.emaildavid.mera@usc.es
dc.contributor.emailmanel.cotos@usc.es
dc.contributor.emails.villarroya@usc.es
dc.contributor.signatureAller, Martín
dc.contributor.signatureMera, David
dc.contributor.signatureCotos, José Manuel
dc.contributor.signatureVillarroya, Sebastián
dc.date.accessioned2023-09-09T21:10:27Z
dc.date.available2023-09-09T21:10:27Z
dc.date.issued2023-09-12
dc.description.abstractElectrical Impedance Tomography (EIT) is a non-invasive technique used to obtain the electrical internal conductivity distribution from the interior of bodies. This is a promising method from the manufacturing viewpoint, since it could be used to estimate different physical inner body properties during the production of goods. Nevertheless, this technique requires dealing with an inverse problem that makes its usage in real-time processes challenging. Recently, Machine Learning techniques have been proposed to solve the inverse problem accurately. However, the majority of prior research is focused on qualitative results, and they typically lack a systematic methodology to determine the optimal hyperparameters appropriately. This work presents a systematic comparison of six popular Machine Learning algorithms: Artificial Neural Network, Random Forest, K-Nearest Neighbors, Elastic Net, Ada Boost, and Gradient Boosting. Particularly, the last two algorithms were based on decision tree learners. Furthermore, we studied the relationship between model performance and different EIT configurations. Specifically, we analyzed whether the measurement pattern and the number of used electrodes could increase the model performance. Experiments revealed that tree-based models present high performance, even better than Neural Networks, the most widely-used Machine Learning model to deal with EIT. Experiments also showed a model performance improvement when the EIT configuration was optimized. Most favorable metrics were attained using the tree-based Gradient Boosting model with a combination of both adjacent and mono measurement patterns as well as with 32 electrodes deployed during the tomographic process. With this particular setting, we achieved an accuracy of 99.14% detecting internal artifacts and a Root Mean Square Error of 4.75 predicting internal conductivity distributions.
dc.identifier.citationAller, M., Mera, D., Cotos, J. M., Villarroya, S.: Study and comparison of different Machine Learning-based approaches to solve the inverse problem in Electrical Impedance Tomographies. In: Durán Toro, A. (ed.) Actas de las XXVII Jornadas de Ingeniería del Software y Bases de Datos (JISBD 2023). Sistedes (2023). https://hdl.handle.net/11705/JISBD/2023/3436
dc.identifier.citation-bibtex@inproceedings{11705:JISBD:2023:3436, title = {{Study and comparison of different Machine Learning-based approaches to solve the inverse problem in Electrical Impedance Tomographies}}, author = {Aller, M. and Mera, D. and Cotos, J. M. and Villarroya, S.}, url = {https://hdl.handle.net/11705/JISBD/2023/3436}, crossref = {11705:JISBD:2023} } @proceedings{11705:JISBD:2023, title = {{Actas de las XXVII Jornadas de Ingenier\'{i}a del Software y Bases de Datos (JISBD 2023)}}, author = {Dur\'{a}n Toro, A.}, year = {2023}, publisher = {{Sistedes}}, }
dc.identifier.sistedes11705/JISBD/2023/3436
dc.identifier.urihttps://hdl.handle.net/11705/2518
dc.publisherSistedes
dc.relation.ispartofActas de las XXVII Jornadas de Ingeniería del Software y Bases de Datos (JISBD 2023)
dc.rights.licenseCC BY-NC-ND 4.0
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectMachine Learning
dc.subjectArtificial Neural Networks
dc.subjectGradient Boosting
dc.subjectElectrical Impedance Tomography
dc.titleStudy and comparison of different Machine Learning-based approaches to solve the inverse problem in Electrical Impedance Tomographies
dspace.entity.typeResumen
relation.isAuthorOfAbstract4fdf0a46-2393-4d98-9561-90788621e78c
relation.isAuthorOfAbstract7919985d-1409-4105-80d0-b5ae476f3b7a
relation.isAuthorOfAbstract61ef380f-960e-4a1d-a66d-d65f95b5f93f
relation.isAuthorOfAbstract0a3efd0f-cbe0-4665-a9bb-87264c92c48b
relation.isAuthorOfAbstract.latestForDiscovery4fdf0a46-2393-4d98-9561-90788621e78c

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